Oxford CMI 165
Oxford CMI 165
Oxford/CMI CMI 165
Copper Thickness Measurement with Temperature Compensation
Applications:
· Measures hot or cold Cu on PCBs
· Reduce waste by eliminating the need for coupons
· Measures foil or laminated Cu thickness in μm,mils or oz
· Sort Cu by weight at incoming drilling, shearing or plating
· Quantify Cu thickness after etching or planarizing
· Verify Cu plating thickness on PCB surfaces
The CMI-165 provides unique temperature compensated Copper thickness measurements in an ergonomic hand-held device.
Measurements on Copper are affected by the temperature of the sample. The CMI 165 accounts for temperature in the measurement of thickness ensuring accurate in-process inspection results regardless of Copper temperature.
This versatile portable gauge equipped with protective case, has a rugged and durable design that allows it to be taken into the harshest environments
Specifications:
· SRP-T1 Replaceable Probe Tip - no recalibration necessary
· Spare SRP-T1 ensures no factory downtime
· Illuminated probe tip for easy positioning on copper traces
· User Interface available in both English and Simplified Chinese
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Mr.Tuấn Anh
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Zalo: 0961996596
Email : trananh.elect@gmail.com
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